High-speed and high-precision measurement of batteries and accumulators with sub-micron resolution.
Rich experience in flatness measurement in high-temperature environments, foreign matter inspection during manufacturing processes, edge shape inspection of button batteries, and measurement of separator thickness and coating thickness, etc.!
Our company handles non-contact measurement devices based on the principles of chromatic aberration confocal and interference. These devices can be applied to film thickness measurement, shape measurement, roughness measurement, displacement measurement, and appearance inspection, enabling in-process measurement during manufacturing, high-speed inline inspection, and offline measurement. We offer various interfaces to accommodate embedded applications. Measurements can be performed with high resolution (minimum XY resolution of 1μm and minimum Z resolution of 0.02μm), contributing to improved product quality and reduced time and costs in manufacturing processes. For single-point sensors, we also offer two types of products aimed at lower price points (CHRcodile C, CHRocodile Mini). 【Features】 ■ Wide range of sensor lineup Sensors can be selected according to inspection requirements and materials from various sensor probes. ■ Sensors according to measurement range We provide single-point sensors, line sensor types, and area scan types. ■ Applications Can be utilized for inspection of PCB flex, wire loop inspection, wafer bump inspection, and more. *For more details, please refer to the materials. Feel free to contact us with any inquiries.
- Company：プレシテック・ジャパン
- Price：Other
